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QMT Products: October 2009
Surface measurement integrated on CMM


Renishaw has added a probe option for its  REVO five-axis measurement system, which for the first time, allows surface finish inspection to be fully integrated within CMM measurement routines.

With a measurement capability of 6.3 to 0.05 Ra, the SFP1 surface finish probe provides a  single platform that will eliminate the need for hand-held sensors, or the necessity to move parts to costly dedicated surface finish measuring machines, reducing labour costs and inspection lead times. CMM users will now be able to automatically switch between part scanning and surface finish measurement, with analysis all contained in a single measurement report.

www.renishaw.com
  
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