With its new Vanta range of handheld XRF analysers Olympus aims to offer increased productivity in materials analysis tasks. The rugged design allows elemental analysis and quantification for a wide variety of materials in any setting, and, says Olympus, results are now faster, more accurate and reliable than ever. Applications include alloy recycling, positive material identification (PMI), and geochemistry.
For protection in the harshest environments, the Vanta range has a mesh and shutter to protect the detector from sharp objects and costly repair. The analysers are IP 65 rated for protection against dust and water, and drop tested to military standards. An operating temperature range of -10 °C to +50 °C makes the range suitable for geochemistry and mining discovery programmes in extreme climates.
Elemental analysis and quantification are achieved in just 1-2 seconds, thanks to Olympus’ new Axon XRF processing technology. This increases throughput and ensures analytical confidence, for example streamlining the QC of alloy and material identification. Alongside an internal library of over 700 alloys for comparison, alloy recycling, PMI and precious metal identification can be performed quickly and confidently.
The customisable user interface is easy to use, allowing new operators to perform useful analysis with minimal training. The Vanta instruments also feature embedded GPS for XRF data spatial tracking, removing the need for costly external GPS accessories.