MICROSCIENCE 2010is Europe's largest exhibition showing the latest equipment in microscopy and imaging with over 100 companies exhibiting. It will run alongside a themed International Conference at ExCeL, London from 28 June to 1 July 2010 at ExCeL.
It opens with a reception on Monday 28 June which is followed by three days of conference and exhibition from 29 June to 1 July.The themed conference is complemented by special hands on workshops, the RMS Learning Zone and the exhibition.
Microscience 2010 has also been designated an EMS Extension by the European Microscopy Society and will host the European Society’s General Assembly – when up to 60 representatives from the national societies come together. “The fact that the RMS and its UK counterparts are hosting the European Microscopy Congress in 2012 has made us look even more closely at everything we have done this year. As a result, I think MICROSCIENCE 2010 offers tremendous value to conference delegates and to day-visitors, and it is set to be a truly inclusive event.” said Dr Debbie Stokes, co-chair of the Organising Committee
Plenary Speakers at the conference include Dr Jennifer Lippincott-Schwartz (NIH, US), Professor Wolfgang Baumeister (Max-Planck Institute of Biochemistry, Germany), and Professor Sir John Meurig Thomas (Cambridge, UK). “Professor Baumeister and Professor Thomas are leading figures in the fields of electron imaging for life sciences and materials sciences respectively.” said Dr. Stokes. “And, we have Professor Lippincott Schwartz opening with the RMS Pearse Prize Lecture. All of these talks will stimulate thought and provoke discussion, and will complement the conference sessions perfectly."
The MICROSCIENCE 2010 International Conference has three parallel themes on each day. These are : Life; Materials; and New Techniques and Frontiers
RMS Learning Zone
THE RMS Learning Zone is a major feature of this year’s MICROSCIENCE 2010. It's a fully equipped lab for visitors who can turn-up and learn more about four key areas: SEM, light microscopy, digital microscopy and confocal microscopy.
Updating and improving your skills is an essential component of career development. But, with looming deadlines, proposals to write, and papers to submit, it can be all too easy to overlook. The RMS Learning Zone helps to address this problem. The zone offers scientists and technicians the opportunity to learn new techniques from their peers and the chance to discuss difficulties they may be having with specimen preparation and is free to attendees as part of the Royal Microscopical Society's remit to teach and improve microscopy.
For example, the RMS Learning Zone will have a number of Scanning Electron Microscopes, from bench-top to full-size. These are provided by JEOL, FEI, Hitachi High Technologies and Carl Zeiss SMT - four rival machines side-by-side and fully operational. In this part of the RMS Learning Zone, two talks will be given on how to prepare samples for SEM (including high resolution requirements) and how to get the best out of your SEM. Direct hands-on demonstrations will then follow on the microscopes that will be loaned to the Zone. These will be used for specific demonstrations (eg effects of varying operating conditions) and also provide an opportunity for visitors to bring their own samples along (though they will need to be ready mounted and, if necessary, coated - there will not be any specimen preparation facilities available in the zone).
UK SPM 2010
The annual Scanning Probe Microscopy Meeting, SPM 2010, is also being held at ExCeL, London on 30th June and 1st July as part of MICROSCIENCE 2010. Organised by The Royal Microscopical Society in collaboration with the London Centre for Nanotechnology, the conference will cover a wide range of topics associated with scanning probe microscopy including main techniques such as atomic force microscopy and scanning tunnelling microscopy as well as more specialised versions. A variety of applications from biological molecules, biomaterials, polymers, crystals, metal and catalyst surfaces, nanostructures, nanomanipulation, instrument and probe development, and more, will be explored.
Speakers include; Professor Toshio Ando, of Kanazawa University, Japan who will be presenting on dynamic visualization of protein molecules in action by high-speed AFM; Dr Leo Gross, from IBM Research, Zurich whose theme is individual molecules investigated by noncontact AFM. Invited speakers include; Dr Oleg Kolosov, of Lancaster University who will present on nondestructive nanomechanical mapping of solid state materials by Ultrasonic Force Microscopy - from graphene layers to subsurface quantum dots; Dr Peter Dunstan, from Swansea University looks at near-field investigations of semiconductor crystals and biological complexes; and Dr Matthew Watkins, of the London Centre for Nanotechnology, will present on manipulating atoms and molecules in vacuum and water using dynamic force microscopy: atomistic simulations.l