Infinity QS banner
QMT Products: July 2008
Good practice guide for measurement of smooth surface topography


The “Guide for the measurement of smooth surface topography using coherence scanning interferometry” (Good Practice Guide No. 108) is now available from the National Physical Laboratory (NPL).
This document gives guidance on the measurement of the topography of semiconductors, epitaxial wafers and optical thin film coatings, and can be applied to many flat, smooth surface topography measurements.
This good practice guide has been written to assist users in the effective measurement and analysis of smooth surfaces using coherence scanning interferometry (CSI), commonly referred to as ‘vertical scanning white light interferometry’.
To download or to order a paper copy of the “Guide for the measurement of smooth surface topography using coherence scanning interferometry” (Measurement Good Practice Guide No. 108),  visit:
 www.npl.co.uk/guides

 

  
You can now view all QMT Magazine issues on your favourite tablet or smart phone.
Download the free Quality Manufacturing Today App from the Apple iTunes App Store or from QMT Magazine on Google Play.

Rob Tremain Photographer
www.4exposure.co.uk
slideShow
Click above to see full page display and links to QMT articles.
Untitled
Nikon logo
Mitutoyo logo
Aberlink logo
Hexagon Logo 2
Control logo
Creaform logo
Bowers logo
MACH 2016 logo